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ARL X'TRA粉末衍射仪

X射线衍射 (XRD) 属于多功能无损分析技术,能够快速获得详细的材料结构和相信息。XRD 分析技术能在各种工业和研究应用中提供高质量分析结果,相关应用包括学术研究、化学品、药品、聚合物、半导体、薄膜、金属及矿物等。
赛默飞世尔科技(Thermo Scientific )是分析仪器制造商,其产品以卓Y的稳定性、可靠性、精度、易用性等使用维护性能享誉全球。上海铸金分析仪器有限公司是国内的工业分析仪器检测设备服务商,公司以其精选的伙伴、Z业的知识、优质的服务、合理的价格深受广大用户喜爱和好评。上海铸金分析仪器有限公司与赛默飞世尔科技(Thermo Scientific )友好合作多年,可为江苏、浙江、沪(上海)、安徽等地用户提供赛默飞世尔科技(原美国热电集团)原装正品光谱分析仪器,包括火花直读光谱仪、电感耦合等离子体发射光谱仪、X射线荧光光谱仪、X射线衍射仪、原子吸收光谱仪、分光光度计等产品。上海铸金赛默飞X射线衍射分析仪器包括ARL™ EQUINOX 100 X射线衍射仪、ARL™ EQUINOX 1000 X射线衍射仪、ARL™ EQUINOX 3000 X射线衍射仪、ARL™ EQUINOX 5000 X射线衍射仪、ARL™ EQUINOX 6000 X射线衍射仪、ARL™ 9900 Pot Flux X射线分析仪、ARL9900水泥整体分析仪、ARL™ 9900 X射线工作站、ARL™ X'TRA粉末衍射仪,欢迎咨询选购!
ARL  X'TRA粉末衍射仪
获得对多晶体材料的定性和定量分析。Thermo Scientific™ ARL™ X'TRA粉末衍射仪可在低温和高温、无周围气压条件下对薄膜和小样品的物相转变和结构研究进行定制化操作。
Get better sample data with a flexible solution for high resolution powder X-ray diffraction (XRD). The Thermo Scientific™ ARL™ X'TRA Powder Diffractometer provides qualitative and quantitative analysis of structures, phases and compounds of polycrystalline materials in a versatile, multi-purpose package. This advanced system can be customized for phase transitions and structural investigations at low and high temperatures, nonambient atmosphere, on thin films and small samples in the areas of academic research, chemicals, pharmaceuticals, polymers, semiconductors, metals and minerals.

描述
Powder XRD is one of the most established techniques for identifying and characterizing polycrystalline materials with respect to their crystallography, polymorphic structures, phases and crystallinity changes.The ARL X'TRA Powder Diffractometer is designed with a modular approach to provide full flexibility, higher diffraction intensities, and superior resolution for a large range of applications covering both inorganic and organic polycrystalline materials.

Recommended for
Identification of single or multiple phases in an unknown sample.
Quantification of known phases of a mixture.
Crystallography – solving crystal structure.
Nonambient analysis – crystal structure changes with temperature, pressure or gas environment.
Surface and thin film analysis.
Texture and stress analysis.

Main Features
Depending on the type of analysis or sample, the system can be easily reconfigured using pre-aligned Plug & Play accessories such as temperature chambers, parallel beam optics and transmission stage.
Built around a vertical theta-theta goniometer of 260mm radius
-Convenient geometry for easy powder sample analysis, sample changer options and use of specialized sample holders;
-Removable dual Soller slits and continuous variable micrometer-controlled slits for adjusting the width of both the incident and diffracted beams.

Advanced Technology
Thermo Scientific™ WinXRD™ Software running under Windows™ 7 as a multitasking 32-bit data collection and analysis package.
Peltier-cooled Si(Li) solid-state detector, tuned for high count rate
-Superior resolution compared to scintillation detector, removes K-Beta and fluorescence radiation thus eliminating the need for filters and monochromators
-Resulting diffraction peak intensities are substantially higher than for other available configurations.

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